|
8th International Conference in Charged Particle Optics 2010 aims to bring together scientific communities from all round the globe. The participants will present their research results and development activities in the field of charged particle optics. Attendees will get a unique chance to explore a wide variety of simulation techniques and methods related to charged particle optics problems, such as aberration computations, direct ray tracing and field distribution solving. The conference will also highlight on wide a range topics including Sources for Field Emission Displays, Electron Mirrors, Multiple Beam Systems, Curved axis systems, Electron/Ion beam lithography, Electron and Ion microscopes, Source/Gun design, Energy and mass spectrometers, Beam transport and characterization, etc.
Visitor Profile
The targeted visitors at the 8th International Conference in Charged Particle Optics 2010 would include:
- Professionals from Research and Development
- Students
- Academicians
- Researchers
- Media
- Engineers
- Physicists
- Scientists
Organizer
CPO